Deep reflectance fields

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Authors: Abhimitra Meka, Christian Häne, Rohit Pandey, Michael Zollhöfer, Sean Fanello, Graham Fyffe, Adarsh Kowdle, Xueming Yu, Jay Busch, Jason Dourgarian, Peter Denny, Sofien Bouaziz, Peter Lincoln, Matt Whalen, Geoff Harvey, Jonathan Taylor, Shahram Izadi, Andrea Tagliasacchi, Paul Debevec, Christian Theobalt, Julien Valentin, Christoph Rhemann

Journal title: ACM Transactions on Graphics

Journal number: 38/4

Journal publisher: Association for Computing Machinary, Inc.

Published year: 2019

Published pages: 1-12

DOI identifier: 10.1145/3306346.3323027

ISSN: 0730-0301