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Authors: Raja Ben Abdessalem, Annibale Panichella, Shiva Nejati, Lionel C. Briand, Thomas Stifter
Journal title: 29th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA '20)
Journal number: July, 2020
Journal publisher: ACM
Published year: 2020
DOI identifier: 10.1145/3395363.3397386
ISBN: 978-1-4503-8008-9
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