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Authors: Dennis Appelt, Cu D. Nguyen, Annibale Panichella, Lionel C. Briand
Journal title: IEEE Transactions on Reliability
Journal number: 67/3
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 733-757
DOI identifier: 10.1109/tr.2018.2805763
ISSN: 0018-9529