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Authors: Seung Yeob Shin, Shiva Nejati, Mehrdad Sabetzadeh, Lionel C. Briand, Frank Zimmer
Journal title: Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis - ISSTA 2018
Journal publisher: ACM Press
Published year: 2018
Published pages: 49-60
DOI identifier: 10.1145/3213846.3213852
ISBN: 9781-450356992