Model-Driven Trace Diagnostics for Pattern-based Temporal Specifications

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Authors: Wei Dou, Domenico Bianculli, Lionel Briand

Journal title: Proceedings of the 21th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems - MODELS '18

Journal publisher: ACM Press

Published year: 2018

Published pages: 278-288

DOI identifier: 10.1145/3239372.3239396

ISBN: 9781-450349499