Summary
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Authors: Tiep M. Hoang; Trinh van Chien; Thien van Luong; Symeon Chatzinotas; Bjorn Ottersten; Lajos Hanzo
Journal title: IEEE Transactions on Information Forensics and Security
Journal number: 17
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
Published pages: 1010 - 1023
DOI identifier: 10.1109/tifs.2022.3155970
ISSN: 1556-6013