Improving the sensitivity of scanning probe microscopy with mechanical vibrations

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Authors: Eylon Persky, Naor Vardi, Yishai Shperber, Beena Kalisky

Journal title: Applied Physics Letters

Journal number: 113/17

Journal publisher: American Institute of Physics

Published year: 2018

Published pages: 173101

DOI identifier: 10.1063/1.5051620

ISSN: 0003-6951