Highly—sensitive phase and frequency noise measurement technique using Bayesian filtering

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Authors: Darko Zibar, HounMan Chin, Yeyu Tong, Nitin Jain, Joel Guo, Lin Chang, Tobias Gehring, John E. Bowers, Ulrik L. Andersen

Journal title: IEEE Photonics Technology Letters

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1-1

DOI identifier: 10.1109/lpt.2019.2945051

ISSN: 1041-1135