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Authors: Zhengying Liu, Adrien Pavao, Zhen Xu, Sergio Escalera, Fabio Ferreira, Isabelle Guyon, Sirui Hong, Frank Hutter, Rongrong Ji, Julio C. S. Jacques Junior, Ge Li, Marius Lindauer, Zhipeng Luo, Meysam Madadi, Thomas Nierhoff, Kangning Niu, Chunguang Pan, Danny Stoll, Sebastien Treguer, Jin Wang, Peng Wang, Chenglin Wu, Youcheng Xiong, Arber Zela, Yang Zhang
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 43/9
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
Published pages: 3108-3125
DOI identifier: 10.1109/tpami.2021.3075372
ISSN: 0162-8828
- Not specified