Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry

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Authors: Yunqing Tang, Francesco Chiabrera, Alex Morata, Iñigo Garbayo, Nerea Alayo, Albert Tarancón

Journal title: Advanced Materials Interfaces

Journal number: 8/6

Journal publisher: Wiley

Published year: 2021

Published pages: 2001881

DOI identifier: 10.1002/admi.202001881

ISSN: 2196-7350