A Cryptographic Test of Quantumness and Certifiable Randomness from a Single Quantum Device

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Authors: Zvika Brakerski, Paul Christiano, Urmila Mahadev, Umesh Vazirani, Thomas Vidick

Journal title: 2018 IEEE 59th Annual Symposium on Foundations of Computer Science (FOCS)

Journal publisher: IEEE

Published year: 2018

Published pages: 320-331

DOI identifier: 10.1109/focs.2018.00038

ISBN: 978-1-5386-4230-6