Back-Projection Based Fidelity Term for Ill-Posed Linear Inverse Problems

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Authors: Tom Tirer, Raja Giryes

Journal title: IEEE Transactions on Image Processing

Journal number: 29

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 6164-6179

DOI identifier: 10.1109/tip.2020.2988779

ISSN: 1057-7149