RepMet: Representative-Based Metric Learning for Classification and Few-Shot Object Detection

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Authors: Leonid Karlinsky, Joseph Shtok, Sivan Harary, Eli Schwartz, Amit Aides, Rogerio Feris, Raja Giryes, Alex M. Bronstein

Journal title: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Journal publisher: IEEE

Published year: 2019

Published pages: 5192-5201

DOI identifier: 10.1109/cvpr.2019.00534

ISBN: 978-1-7281-3293-8