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Authors: R. Schupp, F. Torretti, R. A. Meijer, M. Bayraktar, J. Sheil, J. Scheers, D. Kurilovich, A. Bayerle, A. A. Schafgans, M. Purvis, K. S. E. Eikema, S. Witte, W. Ubachs, R. Hoekstra, O. O. Versolato
Journal title: Applied Physics Letters
Journal number: 115/12
Journal publisher: American Institute of Physics
Published year: 2019
Published pages: 124101
DOI identifier: 10.1063/1.5117504
ISSN: 0003-6951