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Authors: Per Erik Strandberg, Thomas J. Ostrand, Elaine J. Weyuker, Wasif Afzal, Daniel Sundmark
Journal title: Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis
Journal publisher: ACM
Published year: 2020
Published pages: 337-348
DOI identifier: 10.1145/3395363.3397359
ISBN: 9781450380089
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