Industrial Scale Passive Testing with T-EARS

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Authors: Daniel Flemstrom, Henrik Jonsson, Eduard Paul Enoiu, Wasif Afzal

Journal title: 2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST)

Journal publisher: IEEE

Published year: 2021

Published pages: 351-361

DOI identifier: 10.1109/icst49551.2021.00047

ISBN: 978-1-7281-6836-4