A Model-Based Test Script Generation Framework for Embedded Software

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Authors: Muhammad Nouman Zafar, Wasif Afzal, Eduard Paul Enoiu, Athanasios Stratis, Ola Sellin

Journal title: 2021 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Journal publisher: IEEE

Published year: 2021

Published pages: 192-198

DOI identifier: 10.1109/icstw52544.2021.00041

ISBN: 978-1-6654-4456-9