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Authors: Peishuo Li, Tom R. Molderez, Frederik Ceyssens, Korneel Rabaey, Marian Verhelst
Journal title: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)
Journal publisher: IEEE
Published year: 2019
Published pages: 317-320
DOI identifier: 10.1109/esscirc.2019.8902687
ISBN: 978-1-7281-1550-4
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