Soft error vulnerability assessment of the real-time safety-related ARM Cortex-R5 CPU

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Authors: Xabier Iturbe, Balaji Venu, Emre Ozer

Journal title: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2016

Published pages: 91-96

DOI identifier: 10.1109/DFT.2016.7684076

ISBN: 978-1-5090-3623-3