A Fail-Functional Automotive CPU Subsystem Architecture for Mitigating Single Point of Failures

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Balaji Venu, EmreOzer, Xabier Iturbe, Alex Robinson

Journal title: IEEE International Workshop on Automotive Reliability & Test

Journal publisher: IEEE

Published year: 2016