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Authors: Or Avitan, Yoav Y. Schechner, Ehud Behar
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 27 July 2023
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
Published pages: 1-12
DOI identifier: 10.1109/tpami.2023.3299526
ISSN: 0162-8828