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Authors: Navaneetha Channiganathota Manjappa, Anselm Breitenreiter, Markus Ulbricht, Milos Krstic
Journal title: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2018
Published pages: 162-165
DOI identifier: 10.1109/ddecs.2018.00036
ISBN: 978-1-5386-5754-6
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