Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle

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Authors: Yuanqing Li, Anselm Breitenreiter, Marko Andjelkovic, Oliver Schrape, Milos Krstic

Journal title: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2018

Published pages: 9-14

DOI identifier: 10.1109/ddecs.2018.00009

ISBN: 978-1-5386-5754-6