Interference probe ptychography for computational amplitude and phase microscopy

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Authors: Dirk E. Boonzajer Flaes, Stefan Witte

Journal title: Optics Express

Journal number: 26/24

Journal publisher: Optical Society of America

Published year: 2018

Published pages: 31372

DOI identifier: 10.1364/oe.26.031372

ISSN: 1094-4087