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Authors: Lorenz Hehn; Regine Gradl; Martin Dierolf; Kaye S. Morgan; David M. Paganin; Franz Pfeiffer
Journal title: IEEE TMI
Journal number: 3
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
DOI identifier: 10.1109/tmi.2019.2962615
ISSN: 0278-0062