Summary
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Authors: Rafael C. Schick; Thomas Koehler; Wolfgang Noichl; Fabio De Marco; Konstantin Willer; Theresa Urban; Manuela Frank; Thomas Pralow; Ingo Maack; Sven Prevrhal; Bernd Lundt; Alexander A. Fingerle; Daniela Pfeiffer; Julia Herzen; Franz Pfeiffer
Journal title: IEEE TMI
Journal number: 28
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tmi.2021.3126492
ISSN: 0278-0062