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Authors: Kirsten Taphorn; Korbinian Mechlem; Thorsten Sellerer; Fabio De Marco; Manuel Viermetz; Franz Pfeiffer; Daniela Pfeiffer; Julia Herzen
Journal title: IEEE TMI
Journal number: 29
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
DOI identifier: 10.1109/tmi.2021.3061253
ISSN: 0278-0062