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Authors: Clemens Schmid; Manuel Viermetz; Nikolai Gustschin; Wolfgang Noichl; Jakob Haeusele; Tobias Lasser; Thomas Koehler; Franz Pfeiffer
Journal title: IEEE TMI
Journal number: 3
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tmi.2022.3217662
ISSN: 0278-0062