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Authors: Manuel Viermetz; Nikolai Gustschin; Clemens Schmid; Jakob Haeusele; Peter B. Noel; Roland Proksa; Stefan Loscher; Thomas Koehler; Franz Pfeiffer
Journal title: IEEE TMI
Journal number: 18
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.36227/techrxiv.20715286.v1
ISSN: 0278-0062