Three-Dimensional Imaging of Beam-Induced Biasing of InP/GaInP Tunnel Diodes

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Authors: Cristina Cordoba, Xulu Zeng, Daniel Wolf, Axel Lubk, Enrique Barrigón, Magnus T. Borgström, Karen L. Kavanagh

Journal title: Nano Letters

Journal number: 19/6

Journal publisher: American Chemical Society

Published year: 2019

Published pages: 3490-3497

DOI identifier: 10.1021/acs.nanolett.9b00249

ISSN: 1530-6984