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Authors: Aliaksandr Siarohin, Stéphane Lathuilière, Enver Sangineto, Nicu Sebe
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
DOI identifier: 10.1109/tpami.2019.2947427
ISSN: 0162-8828