Summary
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Authors: Sukhpreet Singh Michal Kozlowski Irene Garcia-Lopez Zhou Jiang Esther Rodriguez-Villegas
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tim.2021.3083415
ISSN: 0018-9456