Compressed sensing recovery using computational memory

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Authors: M. Le Gallo, A. Sebastian, G. Cherubini, H. Giefers, E. Eleftheriou

Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2017

Published pages: 28.3.1-28.3.4

DOI identifier: 10.1109/iedm.2017.8268469

ISBN: 978-1-5386-3559-9