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Authors: Manuel Le Gallo, Abu Sebastian, Giovanni Cherubini, Heiner Giefers, Evangelos Eleftheriou
Journal title: IEEE Transactions on Electron Devices
Journal number: 65/10
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 4304-4312
DOI identifier: 10.1109/ted.2018.2865352
ISSN: 0018-9383