Summary
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Authors: A. Sebastian, I. Boybat, M. Dazzi, I. Giannopoulos, V. Jonnalagadda, V. Joshi, G. Karunaratne, B. Kersting, R. Khaddam-Aljameh, S. R. Nandakumar, A. Petropoulos, C. Piveteau, T. Antonakopoulos, B. Rajendran, M. Le Gallo, E. Eleftheriou
Journal title: 2019 Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2019
Published pages: T168-T169
DOI identifier: 10.23919/vlsit.2019.8776518
ISBN: 978-4-86348-719-2