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Authors: Tristan Venot, Arthur Desbois, Marie-Constance Corsi, Laurent Hugueville, Ludovic Saint-Bauzel, Fabrizio de Vico Fallani
Journal title: International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/metroxraine54828.2022.9967624
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