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Authors: Marie-Constance Corsi; Sylvain Chevallier; Fabrizio De Vico Fallani; Florian Yger
Journal title: IEEE TBME
Journal number: 4
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tbme.2022.3154885
ISSN: 0018-9294
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