A look at the dark side of hardware reverse engineering - a case study

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Authors: Sebastian Wallat, Marc Fyrbiak, Moritz Schlogel, Christof Paar

Journal title: 2017 IEEE 2nd International Verification and Security Workshop (IVSW)

Journal publisher: IEEE

Published year: 2017

Published pages: 95-100

DOI identifier: 10.1109/ivsw.2017.8031551

ISBN: 978-1-5386-1708-3