SAT-based reverse engineering of gate-level schematics using fault injection and probing

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Authors: Shahrzad Keshavarz, Falk Schellenberg, Bastian Richte, Christof Paar, Daniel Holcomb

Journal title: 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)

Journal publisher: IEEE

Published year: 2018

Published pages: 215-220

DOI identifier: 10.1109/hst.2018.8383918

ISBN: 978-1-5386-4731-8