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Authors: Arunkumar Vijayakumar, Vinay C. Patil, Daniel E. Holcomb, Christof Paar, Sandip Kundu
Journal title: IEEE Transactions on Information Forensics and Security
Journal number: 12/1
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2017
Published pages: 64-77
DOI identifier: 10.1109/tifs.2016.2601067
ISSN: 1556-6013