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Authors: Marc Fyrbiak, Sebastian Strauss, Christian Kison, Sebastian Wallat, Malte Elson, Nikol Rummel, Christof Paar
Journal title: 2017 IEEE 2nd International Verification and Security Workshop (IVSW)
Journal publisher: IEEE
Published year: 2017
Published pages: 88-94
DOI identifier: 10.1109/ivsw.2017.8031550
ISBN: 978-1-5386-1708-3
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