NodeRacer: Event Race Detection for Node.js Applications

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Authors: André Takeshi Endo, Anders Møller

Journal title: 2020 IEEE 13th International Conference on Software Testing, Verification and Validation

Journal number: ICST 2020

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2020

DOI identifier: 10.1109/icst46399.2020.00022