Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction

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Authors: Rik V. Mom, Luis-Ernesto Sandoval-Diaz, Dunfeng Gao, Cheng-Hao Chuang, Emilia A. Carbonio, Travis E. Jones, Rosa Arrigo, Danail Ivanov, Michael Hävecker, Beatriz Roldan Cuenya, Robert Schlögl, Thomas Lunkenbein, Axel Knop-Gericke, Juan-Jesús Velasco-Vélez

Journal title: ACS Appl. Mater. Interfaces

Journal number: 15

Journal publisher: American Chemical Society

Published year: 2023

Published pages: 30052-30059

DOI identifier: 10.1021/acsami.2c23007

ISSN: 1944-8244