In-situ TEM investigation of toughening in Silicon at small scales

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Authors: I. Issa, C. Gammer, S. Kolitsch, A. Hohenwarter, P.J. Imrich, R. Pippan, D. Kiener

Journal title: Materials Today

Journal number: 48, 29

Journal publisher: Elsevier BV

Published year: 2021

DOI identifier: 10.1016/j.mattod.2021.03.009

ISSN: 1369-7021