Planar Dual‐Gate Paper/Oxide Field Effect Transistors as Universal Logic Gates

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Authors: Diana Gaspar, Jorge Martins, Pydi Bahubalindruni, Luís Pereira, Elvira Fortunato, Rodrigo Martins

Journal title: Advanced Electronic Materials

Journal number: 4/12

Journal publisher: John Wiley and Sons

Published year: 2018

Published pages: 1800423

DOI identifier: 10.1002/aelm.201800423

ISSN: 2199-160X