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Authors: Mariano Ceccato, Davide Corradini, Luca Gazzola, Fitsum Meshesha Kifetew, Leonardo Mariani, Matteo Orru, Paolo Tonella
Journal title: 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)
Journal publisher: IEEE
Published year: 2020
Published pages: 286-296
DOI identifier: 10.1109/icst46399.2020.00037
ISBN: 978-1-7281-5778-8
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