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Authors: Jinhan Kim, Nargiz Humbatova, Gunel Jahangirova, Paolo Tonella, Shin Yoo
Journal title: Proceedings of the IEEE Conference on Software Testing, Verification and Validation
Journal publisher: IEEE
Published year: 2023
Published pages: pp. 234-245
DOI identifier: 10.1109/icst57152.2023.00030
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