Summary
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Authors: Erkuden Rios, Eider Iturbe, Maria Carmen Palacios
Journal title: Proceedings of the 12th International Conference on Availability, Reliability and Security - ARES '17
Journal publisher: ACM Press
Published year: 2017
Published pages: 1-9
DOI identifier: 10.1145/3098954.3104059
ISBN: 9781-450352574
