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Authors: Marta Pita-Vidal, Arno Bargerbos, Chung-Kai Yang, David J. van Woerkom, Wolfgang Pfaff, Nadia Haider, Peter Krogstrup, Leo P. Kouwenhoven, Gijs de Lange, Angela Kou
Journal title: Physical Review Applied
Journal number: 23317019
Journal publisher: 10.1103/PhysRevApplied.14.064038
Published year: 2020
DOI identifier: 10.1103/physrevapplied.14.064038
ISSN: 2331-7019
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