Ion-beam deposited platinum as electrical contacting material in operando electron microscopy experiments at elevated temperatures

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Authors: S.B. Simonsen, Z. Ma, E. Mariegaard, S.D. Angelis, W.L. Dacayan, K.S. Mølhave, C. Chatzichristodoulou

Journal title: Microscopy Research and Technique

Journal publisher: Wiley

Published year: 2023

ISSN: 1097-0029